The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Apr. 27, 2016
Applicant:

Hioki Denki Kabushiki Kaisha, Nagano, JP;

Inventors:

Masao Higuchi, Nagano, JP;

Fumio Tokutake, Nagano, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); H02S 50/10 (2014.01); H02S 50/00 (2014.01);
U.S. Cl.
CPC ...
H02S 50/10 (2014.12); H02S 50/00 (2013.01);
Abstract

A solar cell testing apparatus tests bypass diodes in a solar cell string, which is constructed of solar cell modules including solar cells and the bypass diodes, for open-position failures and includes: a unidirectional element connected between positive and negative electrodes of the solar cell string so as to permit passage of the current outputted when the solar cells generate power; a voltage applier that apples a test voltage, which exceeds a sum of forward direction voltages of the bypass diodes and sets the negative electrode potential higher than the positive electrode potential, across the positive and negative electrodes; a current detector that detects a current flowing in the solar cell string; and a processor that tests for open-position failures by comparing currents detected before and after application of the test voltage with the unidirectional element connected between the electrodes of the solar cell string.


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