The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Dec. 29, 2012
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hideyuki Kobayashi, Tokyo, JP;

Masahiro Watanabe, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02J 3/00 (2006.01); G05B 15/02 (2006.01);
U.S. Cl.
CPC ...
H02J 3/00 (2013.01); G05B 15/02 (2013.01); Y04S 10/18 (2013.01); Y04S 20/48 (2013.01);
Abstract

A control command apparatus in a power system selecting a measuring apparatus according to a power system state, includes: a measuring apparatus extraction unit () extracting a measuring apparatus () between a first and second control apparatus () downstream the first control apparatus (), or a measuring apparatus () downstream the first control apparatus () if no second control apparatus () exists, when a predetermined condition is satisfied, based on system configuration information (), and generating measuring apparatus information () associating the extracted measuring apparatus () and the first control apparatus () with each other; and a control command generation unit () acquiring a measurement value from the measuring apparatus (), identifying a control apparatus () associated with the measuring apparatus () as a the measurement value source based on the measuring apparatus information (), and calculating and outputting a control parameter to the identified control apparatus ().


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