The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Apr. 27, 2015
Applicant:

Invensense, Inc., San Jose, CA (US);

Inventors:

Jong Il Shin, San Jose, CA (US);

Peter Smeys, San Jose, CA (US);

Jongwoo Shin, Pleasanton, CA (US);

Assignee:

INVENSENSE, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); B81C 1/00 (2006.01);
U.S. Cl.
CPC ...
H01L 24/83 (2013.01); B81C 1/00238 (2013.01); B81B 2207/012 (2013.01); B81C 2203/019 (2013.01); B81C 2203/035 (2013.01); B81C 2203/0792 (2013.01); H01L 2224/83065 (2013.01); H01L 2224/83805 (2013.01); H01L 2224/83951 (2013.01);
Abstract

Methods for bonding two wafers are disclosed. In one aspect, a first wafer includes an integrated circuit and the second wafer including a MEMS device. The method comprises depositing a bond pad on a metal on the first wafer and sequentially bonding the first wafer to the second wafer utilizing first and second temperatures. The second wafer is bonded to the bond pad at the first temperature and the bond pad and the metal are bonded at the second temperature. In another aspect, a first wafer including an integrated circuit, the second wafer includes a MEMS device. The method comprises depositing a bond pad on a metal on one of the first wafer and the second wafer and bonding the first wafer to the second wafer at a first temperature via a direct bond interface. The method includes bonding the bond pad to the metal at a second temperature.


Find Patent Forward Citations

Loading…