The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Feb. 09, 2015
Mitsubishi Electric Corporation, Tokyo, JP;
Katsuaki Murakami, Kumamoto, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
A plurality of source signal lines extend parallel to each other. A plurality of gate signal lines extend parallel to each other and intersect the plurality of source signal lines. At least any one of array inspecting terminals is provided. The one array inspecting terminal is connected to two or more signal lines of the plurality of gate signal lines. The other array inspecting terminal is connected to two or more signal lines of the plurality of source signal lines. To perform an inspection for a unit of the two or more signal lines by detecting a value of a voltage or a current generated in the signal lines, the array inspecting terminals are configured to receive an inspection signal for generating the voltage or the current.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile