The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Apr. 28, 2015
Applicant:

Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);

Inventors:

Yong Xiao, Ann Arbor, MI (US);

Chen Feng, Ann Arbor, MI (US);

Yuichi Taguchi, Arlington, MA (US);

Vineet R. Kamat, Ann Arbor, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/60 (2017.01); G06T 7/73 (2017.01); G06T 7/12 (2017.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
G06T 7/602 (2013.01); G06K 9/00 (2013.01); G06T 7/12 (2017.01); G06T 7/62 (2017.01); G06T 7/75 (2017.01); G06T 2200/04 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30244 (2013.01);
Abstract

A method determines dimensions in a scene by first acquiring a depth image of the scene acquired by a sensor, and extracting planes from the depth image. Topological relationships of the planes are determined. The dimensions are determined based on the planes and the topological relationships. A quality of the dimensions is evaluated using a scene type, and if the quality is sufficient outputting the dimensions, and otherwise outputting a guidance to reposition the sensor.


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