The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Nov. 11, 2015
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Rajesh Ramamurthy, Clifton Park, NY (US);

Kevin George Harding, Niskayuna, NY (US);

Yi Liao, Oklahoma City, OK (US);

Ratnadeep Paul, Cohoes, NY (US);

Tao Jia, Glenville, NY (US);

Xiaoming Du, Shanghai, CN;

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06K 9/62 (2006.01); G06T 7/60 (2017.01); G06K 9/52 (2006.01); G06T 17/20 (2006.01); G06K 9/46 (2006.01); G06T 15/10 (2011.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06K 9/4604 (2013.01); G06K 9/52 (2013.01); G06K 9/6202 (2013.01); G06T 7/0042 (2013.01); G06T 7/0085 (2013.01); G06T 7/60 (2013.01); G06T 15/10 (2013.01); G06T 17/20 (2013.01); G06T 2200/04 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30164 (2013.01);
Abstract

An automated measurement system includes multi-axis imager configured to receive images of a workpiece wherein the images include visual information about the workpiece at a plurality of focus planes or visual information about the workpiece between at least two focus planes. The multi-axis imager is also configured to determine a point cloud of a plurality of 3 D data points wherein each of the plurality of 3 D data points represents an intersection of one of the plurality of focus planes with a surface of the workpiece or positional information of the workpiece in a de-focused area between the at least two focus planes. The multi-axis imager is further configured to determine a plurality of dimensions of features of the workpiece and compare the determined plurality of dimensions of the features to manufacturing specifications corresponding to at least some of the determined plurality of dimensions of the features.


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