The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Dec. 11, 2012
Siemens Aktiengesellschaft, Munich, DE;
Hans-Christoph Becker, Starnberg, DE;
Ute Feuerlein, Erlangen, DE;
Michael Scheuering, Nuremberg, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A control method is disclosed for determining a quality indicator of medical technology recording results data from a tomography scan of an examination structure, which scan is supported by a contrast agent, by way of a tomography system. According to an embodiment of the invention, at least one control parameter value is automatically derived from the recording results data in respect of a contrast agent image region during and/or directly after the tomography scan, which value represents a quality of the recording results data in the contrast agent image region. A control system for such a determination is also disclosed.