The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Feb. 14, 2013
Applicant:
Nihon Kohden Corporation, Shinjuku-ku, Tokyo, JP;
Inventors:
Assignee:
NIHON KOHDEN CORPORATION, Shinjuku-Ku, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); A61B 5/0205 (2006.01); A61B 5/044 (2006.01); A61B 5/00 (2006.01); A61B 5/021 (2006.01); A61B 5/0464 (2006.01);
U.S. Cl.
CPC ...
G06F 19/3406 (2013.01); A61B 5/021 (2013.01); A61B 5/0205 (2013.01); A61B 5/044 (2013.01); A61B 5/7282 (2013.01); A61B 5/743 (2013.01); A61B 5/746 (2013.01); A61B 5/0464 (2013.01); A61B 5/742 (2013.01);
Abstract
It is formed, on a display, a first display region in which at least one of measurement signals related to biological information of a subject is displayed in real time. It is formed, on the display, a second display region at a position where is not overlapping with the first display region. A first history display region and a second history display region are displayed in the second display region. The first history display region displays a history related to a first one of the measurement signals, and the second history display region displaying a history related to a second one of the measurement signals.