The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Jun. 20, 2014
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Michael Zhang, Shanghai, CN;

Benniu Ji, Shanghai, CN;

Jing Gong, Shanghai, CN;

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01);
Abstract

An automated testing system is described for efficient testing of software applications. Locators are used by the test to find user interface elements in an application's graphical user interface during testing. If during a test a user interface element is not found, which may be due to a changed locator during code refactoring, the system finds the user interface element based on the element's type and on previously stored information about the element. Such information can be a snapshot image of the element, the coordinates of the element's location, dimensions of the element, or other information. Once the missing element is found, a new locator for the element is read and the test is performed using the new locator.


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