The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Jan. 02, 2014
International Business Machines Corporation, Armonk, NY (US);
Mark Robert Funk, Mantorville, MN (US);
Aaron Christoph Sawdey, Cannon Falls, MN (US);
Philip Lee Vitale, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Processor performance metrics are assessed by monitoring probes constructed using instruction sequences. A probe comprising an instruction sequence is selected. The instruction sequence can be configured to measure at least one hardware metric. A first probe value is received. The first probe value can be based, at least in part, on the hardware metric. The first probe value can be determined from execution of the probe in a first execution environment. The probe can be executed a second time to determine a second probe value. The second probe value can be based, at least in part, on the hardware metric. The second probe value is determined in a second execution environment including at least one workload. The first probe value and the second probe value can be compared to produce a performance assessment of the second execution environment.