The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Sep. 12, 2014
Applicant:
Caterpillar Inc., Peoria, IL (US);
Inventors:
Assignee:
Caterpillar Inc., Peoria, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/402 (2006.01); G05D 1/02 (2006.01); E01C 19/00 (2006.01); E02F 3/84 (2006.01); E02F 9/20 (2006.01); E02F 9/26 (2006.01);
U.S. Cl.
CPC ...
G05B 19/402 (2013.01); E01C 19/004 (2013.01); E02F 3/841 (2013.01); E02F 9/205 (2013.01); E02F 9/2045 (2013.01); E02F 9/262 (2013.01); G05D 1/0217 (2013.01); G05D 1/0278 (2013.01); G05B 2219/49372 (2013.01); G05D 2201/0202 (2013.01);
Abstract
A system for determining an optimized cut location for a work implement includes a position sensor and a controller. The controller is configured to determine the position of a work surface and perform a coarse analysis along a path based upon the position of the work surface and a coarse analysis parameter threshold to select a selected coarse analysis increment. The controller is further configured to perform a fine analysis along the selected coarse analysis increment based upon the position of the work surface and a fine analysis parameter threshold to select the optimized cut location.