The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
May. 01, 2014
Applicant:
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Inventors:
Michael John Ebstyne, Seattle, WA (US);
Frederik Schaffalitzky, Bellevue, WA (US);
Drew Steedly, Redmond, WA (US);
Georg Klein, Seattle, WA (US);
Ethan Eade, Seattle, WA (US);
Michael Grabner, Seattle, WA (US);
Assignee:
MICROSOFT TECHNOLOGY LICENSING, LLC, Redmond, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/01 (2006.01); G06F 3/01 (2006.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
G02B 27/0172 (2013.01); G02B 27/017 (2013.01); G06F 3/012 (2013.01); G06F 3/017 (2013.01); G06T 7/80 (2017.01); G06T 7/85 (2017.01); G02B 2027/0178 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30204 (2013.01);
Abstract
Embodiments related to mapping an environment of a machine-vision system are disclosed. For example, one disclosed method includes acquiring image data resolving one or more reference features of an environment and computing a parameter value based on the image data, wherein the parameter value is responsive to physical deformation of the machine-vision system.