The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Apr. 25, 2014
Applicant:

Korea Research Institute of Standards and Science, Daejeon, KR;

Inventors:

Kiwoong Kim, Daejeon, KR;

Chan-Seok Kang, Daejeon, KR;

Seong-Joo Lee, Daejeon, KR;

Yong-ho Lee, Daejeon, KR;

Kwon-Kyu Yu, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/44 (2006.01); G01N 24/08 (2006.01); G01R 33/32 (2006.01);
U.S. Cl.
CPC ...
G01R 33/448 (2013.01); G01N 24/08 (2013.01); G01R 33/445 (2013.01); G01R 33/326 (2013.01);
Abstract

Provided are an object discrimination method and an object discrimination apparatus using an ultra-low magnetic field nuclear magnetic resonance (NMR). The method includes measuring the respective spin-lattice relaxation times at a plurality of strengths of prepolarization magnetic fields with respect to a measurement target and classifying the measurement target using the spin-lattice relaxation times.


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