The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Sep. 24, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Sooyong Park, Asan-si, KR;

Yong chul Jang, Asan-si, KR;

Kijae Song, Goyang-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0408 (2013.01); G01R 31/2889 (2013.01);
Abstract

Provided is a test board including a main board which is configured to be connected to a plurality of devices-under-test (DUTs) and includes a plurality of test signal paths for transmitting a plurality of test signals input from an external tester to pins of at least one of the DUTs or transmitting a test result from the DUT to the tester, and a farm board which is connected to the main board and configured to mount therein a plurality of passive elements which are configured to be connected to at least one of the pins of the DUT through at least one of the test signal paths of the main board, when a test operation is performed, thereby improving a power integrity property or a signal integrity property in the test operation.


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