The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
May. 14, 2015
Myoung-ki Ahn, Yongin-si, KR;
Jin-woo Ahn, Suwon-si, KR;
Tae-yong JO, Seoul, KR;
Hyeong-min Ahn, Yongin-si, KR;
Tae-hyoung Lee, Suwon-si, KR;
Myoung-ki Ahn, Yongin-si, KR;
Jin-woo Ahn, Suwon-si, KR;
Tae-yong Jo, Seoul, KR;
Hyeong-min Ahn, Yongin-si, KR;
Tae-hyoung Lee, Suwon-si, KR;
Samsung Electronics Co., Ltd., Gyeonggi-Do, KR;
Abstract
A panel inspecting apparatus and method may accurately inspect image quality of a curved portion of a panel with relatively small inspecting cost and time, and the panel inspecting apparatus may have a relatively simple structure. The panel inspecting apparatus includes a support on which a panel is disposed, a mirror corresponding to a curved area of the panel, a lens configured to receive an image from the panel and an image reflected by the mirror and focus the images, and an image sensor configured to capture the images transferred via the lens.