The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Mar. 10, 2011
Applicants:
Christian Eggeling, Hamburg, DE;
Kaupo Palo, Harjumaa, EE;
Nicolas Fay, Hamburg, DE;
Maciej Hoffman-wecker, Hamburg, DE;
Pierre Ilouga, Hamburg, DE;
Inventors:
Christian Eggeling, Hamburg, DE;
Kaupo Palo, Harjumaa, EE;
Nicolas Fay, Hamburg, DE;
Maciej Hoffman-Wecker, Hamburg, DE;
Pierre Ilouga, Hamburg, DE;
Assignee:
EVOTEC AG, Hamburg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6445 (2013.01); G01N 2201/1215 (2013.01);
Abstract
A method for identifying the impact on data, such as experimental data, of interfering effects, such as unwanted auto-fluorescence, fluorescence quenching, and fluorescent-sample deterioration, whether or not the data fulfill certain criteria with respect to a threshold indicative of the interfering effects.