The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Aug. 22, 2014
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Falk Schlaudraff, Butzbach/Nieder-Weisel, DE;
Qing Tang, The Woodlands, TX (US);
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A method for calibrating a laser deflection device in a reflected light device of a microscope of a laser microdissection system having a digital image capturing unit comprising an image evaluation module includes generating a laser beam; guiding the laser beam through a microscope objective; directing the laser beam to a position defined by actuation signals; placing a calibration object in the object plane of the microscope objective; actuating the laser deflection device using first actuation signals and first calibration values, making at least one calibration mark on the calibration object; capturing an image of the calibration object by the digital image capturing unit; determining actual position values for the at least one calibration mark: and determining second calibration values based on a relationship between the default position values and the actual position values.