The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Jun. 02, 2015
Applicants:

Ming Xiao, Huntingdon Valley, PA (US);

Justin Sibert, Philadelphia, PA (US);

Inventors:

Ming Xiao, Huntingdon Valley, PA (US);

Justin Sibert, Philadelphia, PA (US);

Assignee:

Drexel University, Philadelphia, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12N 15/10 (2006.01); C07H 21/02 (2006.01); G06F 19/18 (2011.01);
U.S. Cl.
CPC ...
C12N 15/1068 (2013.01); C12Q 1/6806 (2013.01); G06F 19/18 (2013.01);
Abstract

The present invention relates to innovative means of generating sequence-linked DNA fragments and subsequent uses of such linked DNA fragments for de novo haplotype-resolved whole genome mapping and massively parallel sequencing. In various embodiments described herein, the methods of the invention relate to methods of generating paired-end nucleic acid fragment sharing common linker nucleic acid sequences using a nicking endonuclease, a T7 endonuclease, a restriction enzyme, or a transposase, methods of analyzing the nucleotides sequences from the linked-paired-end sequenced fragments, and methods of de novo whole genome mapping. Thus, the methods of this invention allow establishing sequence contiguity across the whole genome, and achieving high-quality, low-cost de novo assembly of complex genomes.


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