The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Apr. 29, 2015
Applicant:

Heliae Development Llc, Gilbert, AZ (US);

Inventors:

Eneko Ganuza Taberna, Phoenix, AZ (US);

Jason D Licamele, Scottsdale, AZ (US);

Anna Lee Tonkovich, Gilbert, AZ (US);

Michael V Bellefeuille, Mesa, AZ (US);

Cameron Wyatt, Gilbert, AZ (US);

Assignee:

Heliae Development LLC, Gilbert, AZ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12N 1/12 (2006.01); C12Q 3/00 (2006.01);
U.S. Cl.
CPC ...
C12N 1/12 (2013.01); C12Q 3/00 (2013.01);
Abstract

Methods of culturing microorganisms in combinations of phototrophic, mixotrophic, and heterotrophic culture conditions are disclosed. A culture of microorganisms may be transitioned between culture conditions over the life of a culture in various combinations, utilizing various conditions in a sequential manner to optimize the culture for growth or product accumulation.


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