The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Aug. 29, 2016
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventor:

Masahiro Katakura, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/06 (2006.01); A61B 1/00 (2006.01); G02B 23/24 (2006.01); A61B 1/07 (2006.01);
U.S. Cl.
CPC ...
A61B 1/00096 (2013.01); G02B 23/243 (2013.01); G02B 23/2469 (2013.01); A61B 1/00188 (2013.01); A61B 1/06 (2013.01); A61B 1/07 (2013.01); G02B 23/2438 (2013.01);
Abstract

This endoscope includes an observation optical system capable of changing a magnified observation and a normal observation with each other, and a plurality of illumination optical systems, wherein a most tip side lens surface of at least one of the illumination optical systems is disposed at a position which is closer to a proximal end side than a most tip side lens surface of the observation optical system, and the following conditional expressions are satisfied.0.03<_Back(max)/<2  (1)1.05<<5  (2) In the expression, D_Back(max) is a maximum value of a distance between the most tip side lens surface and the most tip side lens surface, ft is a focal length in a close-distance magnified observation state, and fw is a focal length in a normal observation state.


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