The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Sep. 14, 2015
Appareo Systems, Llc, Fargo, ND (US);
Nicholas L. Butts, West Fargo, ND (US);
Marshall T. Bremer, Fargo, ND (US);
Jonathan L. Tolstedt, Fargo, ND (US);
Appareo Systems, LLC, Fargo, ND (US);
Abstract
A grain quality sensor comprising a lens, a filter, a photosite array, an illumination source, and an electronics module, wherein the illumination source directs light containing a known set of wavelengths onto a crop sample, wherein the lens picks up light reflected by the crop sample and directs it into the filter, which allows light to pass into different parts of the photosite array such that certain locations on the photosite array only get certain frequencies of the reflected light, wherein the electronics module is electrically connected to the photosite array and capable of determining which parts of the photosite array received light and what frequency the light received was, wherein the electronics module can analyze the optical data received by the photosite array, and wherein the analysis of the optical data is used to determine the composition of different parts of the crop sample.