The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Aug. 14, 2014
Applicant:

Keyence Corporation, Osaka, JP;

Inventor:

Masato Shimodaira, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2006.01); H04N 13/02 (2006.01); G06T 7/521 (2017.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
H04N 13/0253 (2013.01); G06T 7/521 (2017.01); G06T 7/593 (2017.01); H04N 13/00 (2013.01); G06T 2207/10021 (2013.01); H04N 2013/0081 (2013.01);
Abstract

A three-dimensional image processing apparatus includes: a distance image generating part capable of generating a distance image based on a plurality of images captured in an image capturing part; a pattern generating part for generating a first projection pattern and a second projection pattern whose fringe direction is different from that of the first projection pattern as a plurality of projection patterns obtained by changing a fringe direction of a projection pattern; and an incorrect-height determining part for making comparison in height information of a corresponding portion of an inspection target between a first distance image, generated in the distance image generating part based on a first pattern projected image, and a second distance image, generated based on a second pattern projected image, to determine height information of a portion where a difference not smaller than a predetermined value has occurred as incorrect.


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