The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Dec. 30, 2015
Industrial Technology Research Institute, Hsin-Chu, TW;
Wei-Cheng Liu, Zhubei, TW;
Yu-Chung Chen, Miaoli County, TW;
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsin-Chu, TW;
Abstract
A wide-angle lens calibration system is provided, which may include a rotation unit, an image input unit, and a processing unit. A lens to be calibrated may be disposed on the rotation unit; the rotation direction of the rotation unit may be parallel to the horizontal direction; the optical axis center of the lens may be aligned with a reference object. The image input unit may receive images from the lens. The processing unit may control the rotation unit to rotate and analysis the images received from the lens. The processing unit may execute a distortion calibration process, wherein the processing unit may continuously rotate the rotation unit by a predetermined angle and then record the distance between the position of the reference object in the image and the optical axis center and a total rotation angle after each rotation so as to establish a distortion calibration model.