The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Nov. 10, 2014
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Zachary Thomas Crowell, Redmond, WA (US);

Julien Jacques Ellie, Issaquah, WA (US);

Divij Gupta, Seattle, WA (US);

Nishant Jain, Seattle, WA (US);

Michael Sean Mayo, Seattle, WA (US);

John Christopher Mikula, Seattle, WA (US);

Benjamin David Newman, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 9/455 (2006.01);
U.S. Cl.
CPC ...
H04L 63/145 (2013.01); G06F 9/45533 (2013.01);
Abstract

Technologies are described herein for scanning machine images using a scanning service to identify potential risks. The scanning service may be associated with a service provider network. A scan request is received at the scanning service that requests machine images to be scanned. One or more scans may be performed on each of the machine images. An execution environment may host a machine image during a scan of the machine image. Scan result data associated with the scans is stored. The scan result data may be used to provide scan results to the requestor.


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