The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Dec. 20, 2012
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Russell Laporte, Webster, MA (US);

Daniel Collins, Princeton, MA (US);

Ankita Pawar, Raleigh, NC (US);

Jun Liang, Worcester, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/10 (2013.01);
Abstract

The subject disclosure is directed towards providing a user with impact-related information regarding the impact of a monitored event (for a detected resource issue) to a managed system, such as a storage system. An event is generated when a resource such as a hard disk has an issue, e.g., has failed. Information from the event is automatically extracted and used to communicate with a management program coupled to the resource. Communication with the management program obtains information as to the impact the resource issue has to the system, e.g., what servers and/or applications are impacted. The impact-related data may be presented in a report to a user.


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