The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Sep. 15, 2014
Oracle International Corporation, Redwood Shores, CA (US);
Thyagaraju Poola, Sunnyvale, CA (US);
Venkata Ramana Karpuram, Fremont, CA (US);
Vladimir Volchegursky, Redwood City, CA (US);
Madeline Mirzoeff, San Francisco, CA (US);
ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);
Abstract
Systems, methods, and other embodiments associated with event driven metric data collection optimization are described. In one embodiment, a method includes providing a domain knowledge catalog that defines, for each of a plurality of source metrics: i) a plurality of target type relationships and ii) for each target type relationship, a plurality of metrics that are related to the source metric. For a particular system, a deployment topology is determined defines target entities that are included in the system, where the target entities comprise respective instances of a subset of the target type relationships. The method includes receiving configuration of an event related to a source metric. The domain knowledge catalog is accessed and metrics that are related to the subset of target type relationships for the source metric are selected for collection.