The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Jun. 11, 2015
Applicants:

Opel Solar, Inc., Storrs Mansfield, CT (US);

The University of Connecticut, Farmington, CT (US);

Inventor:

Geoff W. Taylor, Mansfield, CT (US);

Assignees:

Opel Solar, Inc., Stoers Mansfield, CT (US);

THE UNIVERSITY OF CONNECTICUT, Farmington, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/778 (2006.01); H01L 21/8249 (2006.01); H01L 21/311 (2006.01); H01L 21/02 (2006.01); H01L 31/18 (2006.01); H01L 31/0352 (2006.01); H01L 31/111 (2006.01); H01S 5/343 (2006.01); H01S 5/026 (2006.01); H01L 29/45 (2006.01); H01L 29/06 (2006.01); H01L 29/08 (2006.01); H01L 29/10 (2006.01); H01L 21/265 (2006.01); H01L 21/285 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7783 (2013.01); H01L 21/02178 (2013.01); H01L 21/31111 (2013.01); H01L 21/31144 (2013.01); H01L 21/8249 (2013.01); H01L 29/452 (2013.01); H01L 31/035236 (2013.01); H01L 31/1113 (2013.01); H01L 31/184 (2013.01); H01S 5/0261 (2013.01); H01S 5/343 (2013.01); H01L 21/2654 (2013.01); H01L 21/28575 (2013.01); H01L 29/0653 (2013.01); H01L 29/0843 (2013.01); H01L 29/1075 (2013.01);
Abstract

A method of forming an integrated circuit employs a plurality of layers formed on a substrate including i) bottom n-type ohmic contact layer, ii) p-type modulation doped quantum well structure (MDQWS) with a p-type charge sheet formed above the bottom n-type ohmic contact layer, iii) n-type MDQWS offset vertically above the p-type MDQWS, and iv) etch stop layer formed above the p-type MDQWS. P-type ions are implanted to define source/drain ion-implanted contact regions of a p-channel HFET which encompass the p-type MDQWS. An etch operation removes layers above the etch stop layer of iv) for the source/drain ion-implanted contact regions using an etchant that automatically stops at the etch stop layer of iv). Another etch operation removes remaining portions of the etch stop layer of iv) to form mesas that define an interface to the source/drain ion-implanted contact regions of the p-channel HFET. Source/Drain electrodes are on such mesas.


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