The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Dec. 30, 2014
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Takao Kachi, Tokyo, JP;

Masayoshi Tarutani, Tokyo, JP;

Yasuhiro Yoshiura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/45 (2006.01); H01L 21/04 (2006.01); H01L 29/861 (2006.01); H01L 29/732 (2006.01); H01L 29/417 (2006.01); H01L 21/285 (2006.01);
U.S. Cl.
CPC ...
H01L 29/456 (2013.01); H01L 21/0485 (2013.01); H01L 21/28512 (2013.01); H01L 21/28568 (2013.01); H01L 29/417 (2013.01); H01L 29/41708 (2013.01); H01L 29/732 (2013.01); H01L 29/8611 (2013.01);
Abstract

According to a first aspect of the present invention, a method of manufacturing semiconductor device includes the step of preparing a silicon substrate. The silicon substrate includes an N-type silicon layer on one surface and at least one of a PN junction, an electrode film, and a protective film on another surface. The method includes the steps of forming a Si—Ti junction by forming a first electrode film made of titanium on the N-type silicon layer; forming a second electrode film made of Al—Si on the first electrode film; forming a third electrode film made of Ni on the second electrode film; and heating the silicon substrate after forming the third electrode film. A titanium silicide layer is not formed between the N-type silicon layer and the first electrode film.


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