The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Mar. 05, 2014
Applicant:

Lockheed Martin Corporation, Bethesda, MD (US);

Inventors:

Alan L. Duncan, Sunnyvale, CA (US);

Richard L. Kendrick, San Mateo, CA (US);

David M. Stubbs, Mountain View, CA (US);

Assignee:

LOCKHEED MARTIN CORPORATION, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/26 (2006.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14627 (2013.01);
Abstract

An imaging system can include of a plurality of pairs of lenslets and a respective plurality of two-dimensional arrays of photonic waveguides arranged in a respective plurality of photonic integrated circuits. Each waveguide can collect light in an airy-disk-size bin to cover a full field of view of the lenslet. Light from each pair of respective waveguides from each pair of lenslets can be demultiplexed into wavelength bins and combined with appropriate phase shifts to enable a measurement of the complex visibility. The complex visibilities from all of the measurements then can be processed to form an image.


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