The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Oct. 25, 2013
Applicant:

Snecma, Paris, FR;

Inventors:

Jerome Lacaille, Rosny Sous Bois, FR;

Tsirizo Rabenoro, Paris, FR;

Assignee:

SNECMA, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07C 5/08 (2006.01); G07C 5/00 (2006.01); B64D 45/00 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G07C 5/0808 (2013.01); B64D 45/00 (2013.01); G05B 23/0251 (2013.01); G07C 5/006 (2013.01); B64D 2045/0085 (2013.01);
Abstract

A system for monitoring a set of components of a device, including: a detecting system including a set of agents for detecting anomalies, with each agent receiving measurements on physical parameters relating to a sub-set of components of a device and delivering an initial distribution of the probability of an anomaly; an acquiring system which receives feedback information and the initial distributions of the probability of an anomaly from the agents; an emerging system which iteratively emerges current distributions of the probability of an anomaly, with the current distributions of the probability of an anomaly converging towards a set of optimum distributions of the probability of an anomaly; and a synthesizing system which synthesizes optimum distributions of the probability of an anomaly relating to at least one sub-set of interest of components of the device in order to extract the risks of an anomaly specific to the sub-set of interest.


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