The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Sep. 02, 2014
Wal-mart Stores, Inc., Bentonville, AR (US);
Jun Xie, San Jose, CA (US);
Chong Sun, Redwood City, CA (US);
Fan Yang, Redwood City, CA (US);
Narasimhan Rampalli, Los Altos, CA (US);
WAL-MART STORES, INC., Bentonville, AR (US);
Abstract
A method of validating rules configured to be utilized in an information extraction application, including: receiving a plurality of labeled samples in a training database; for each of the rules in the rule database: (a) determining, for each of the data points of the plurality of labeled samples in the training database to which the rule applies, whether applying the rule to the data point has a positive or negative impact on matching an output for the data point based on the rule to the assured output of the labeled sample corresponding to the data point; (b) generating positive impact information for the rule based on the positive voters; (c) generating negative impact information for the rule based on the negative voters; and (d) determining a metric for the rule based on the quantity of the negative voters and the quantity of the positive voters; ranking the rules based on the metrics corresponding to the rules; and sending to a user for refinement one or more flagged rules of the rules that have a lowest ranking of the metric. Other embodiments are provided.