The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Oct. 10, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Feng Chen, Beijing, CN;

Miao He, Beijing, CN;

Changrui Ren, Beijing, CN;

Bing Shao, Beijing, CN;

Qin Hua Wang, Beijing, CN;

Wei Wang, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30592 (2013.01);
Abstract

A method for generating cube metadata based on an enhanced star schema may be provided. In some embodiments, the method may include extracting dimension references from a factless fact table in an enhanced star schema. The enhanced star schema may include a fact table, a plurality of dimension tables of the fact table and the factless fact table. In some embodiments, a hierarchy reference may be constructed based on the dimension references. In some embodiments, cube metadata may be generated by combining the hierarchy reference with measures obtained from the fact table and a hierarchy obtained from the dimension tables in the enhanced star schema.


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