The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Apr. 25, 2013
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Sean C. Dolan, Southborough, MA (US);
Dana Naamad, Brookline, MA (US);
Alma Dimnaku, Wellesley, MA (US);
Malak Alshawabkeh, Franklin, MA (US);
Adnan Sahin, Needham, MA (US);
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Techniques for grouping data portions are disclosed. Each group includes data portions determined to exhibit similar behavior. The techniques may include determining whether an affinity measurement with respect to two groups exceeds an affinity threshold; merging the two groups into a single group responsive to the affinity measurement exceeding the affinity threshold; modeling movement of at least one data portion of the single group between two storage tiers at a particular time of day using predicted workload metrics; and performing the data movement of the at least one data portion between the two storage tiers. Predicted workload metrics may be determined by revising first modeled workload metrics using a bias value, where bias values are associated with different times of day, and the bias value is selected based on the particular time of day that the predicted workload metrics are modeling.