The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Jun. 18, 2012
Marc Dymetman, Grenoble, FR;
Guillaume Bouchard, Saint Martin-le-Vinoux, FR;
Marc Dymetman, Grenoble, FR;
Guillaume Bouchard, Saint Martin-le-Vinoux, FR;
XEROX CORPORATION, Norwalk, CT (US);
Abstract
In rejection sampling of a function or distribution p over a space X, a proposal distribution qis refined responsive to rejection of a sample x*εX to generate a refined proposal distribution qselected to satisfy the criteria p(x)≦q(x)≦q(x) and q(x*)<q(x*). In a sampling mode, the sample x* is obtained by random sampling of the space X, the rejection sampling accepts or rejects x* based on comparison of a ratio p(x*)/q(x*) with a random draw, and the refined proposal distribution qis selected to minimize a norm ∥q∥where α<∞. In an optimization mode, the sample x* is obtained such that q*=q(x*) maximizes qover the space X, the rejection sampling accepts or rejects x* based on a difference between or ratio of q* and p(x*), and the refined proposal distribution qis selected to minimize a norm ∥q∥=max{q(x)}.