The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Nov. 10, 2015
Applicant:

National Instruments Corporation, Austin, TX (US);

Inventors:

Julian G. Valdez, Austin, TX (US);

Benjamin R. Weidman, Austin, TX (US);

Dustyn K. Blasig, Pfugerville, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/362 (2013.01);
Abstract

System and method for debugging a graphical program. A graphical program may be received, e.g., from storage, from another process or device, etc. The program includes parallel graphical program portions, each portion including a graphical program structure and/or an execution path in the graphical program. A first graphical program portion of the parallel graphical program portions may be single step debugged, including executing the single step in the first graphical program portion, and executing, in the background, code in each of the other graphical program portions that is scheduled to execute between start and end of the single step in the first graphical program portion.


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