The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Feb. 09, 2015
Oracle International Corporation, Redwood Shores, CA (US);
Guan Nan He, Beijing, CN;
Ying Xi, Beijing, CN;
ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);
Abstract
Systems and methods can use a testing framework for testing an event processing system. The testing framework operates to send one or more input events in an event stream to an event processing system, wherein each said input event is associated with a timestamp. Also, the testing framework can receive one or more actual output events from the event processing system, wherein each said actual output event is associated with a timestamp. Furthermore, the testing framework can compare said one or more actual output events in an event window with one or more expected output events for the event window.