The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Jun. 26, 2015
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/14 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1471 (2013.01); G01N 35/00069 (2013.01); G01N 35/00623 (2013.01); G01N 35/00712 (2013.01); G01N 35/00732 (2013.01); G01N 2035/00633 (2013.01); G06F 2201/805 (2013.01); G06F 2201/84 (2013.01);
Abstract
A test device and a method for controlling the test device are disclosed. After a test is interrupted due to a malfunction of the test device, the test device continuously performs the interrupted testing. The test device for testing a biological material includes: a memory configured to store information which relates to progress of a test; and a controller which, if the test is interrupted due to a malfunction of the test device, is configured to continue performance of the test by using the information which relates to the test progress which is stored in the memory.