The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Jun. 30, 2016
Huawei Technologies Co., Ltd., Shenzhen, CN;
Dritan Celo, Ottawa, CA;
HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;
Abstract
System and method embodiments are provided for optical I/O arrays for wafer scale testing. A wafer includes a plurality of dies of PIC chips. Each die includes a plurality of first and second optical I/O elements each configured to couple to a testing probe array. A row of I/O elements includes alternating ones of the first and second optical I/O elements. Each die also includes a first waveguide and a second waveguide coupling a first one of the first and second optical I/O elements to a second one of the first and second optical I/O elements, respectively. The first and second optical I/O elements configured such that the testing probe array couples to at least some of the first optical I/O elements from a first side of the PIC chip and couples to at least some of the second optical I/O elements from a second side of the PIC chip.