The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Jul. 15, 2013
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Jerome John Griesmer, Mentor, OH (US);
Thomas Leroy Laurence, North Royalton, OH (US);
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/208 (2006.01); G01T 1/164 (2006.01); G01T 1/29 (2006.01); A61B 6/03 (2006.01); G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
G01T 1/208 (2013.01); A61B 6/037 (2013.01); G01T 1/1647 (2013.01); G01T 1/2018 (2013.01); G01T 1/2985 (2013.01);
Abstract
A positron emission tomography (PET) system () and method () classifies gamma events. At least one processor () is programmed to receive event data for a plurality of scintillation events corresponding to gamma events. The gamma events are generated by gamma photons from a region of interest (ROI) (). The gamma events of the event data are classified into a plurality of classifications. The classifications distinguish between single-crystal gamma events and multi-crystal gamma events.