The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Nov. 11, 2014
Applicant:

Denso Corporation, Kariya, Aichi-pref., JP;

Inventors:

Hirofumi Yamamoto, Obu, JP;

Shinichirou Taguchi, Nagoya, JP;

Akira Miki, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/486 (2006.01); G01S 17/10 (2006.01); G01S 17/42 (2006.01); G01S 17/93 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4865 (2013.01); G01S 17/10 (2013.01); G01S 17/42 (2013.01); G01S 17/936 (2013.01);
Abstract

A measurement apparatus measuring a flight time of a search wave corresponding to a time after the search wave is emitted and before a reflected wave is received is provided. The measurement apparatus includes a transceiver, a memory portion, a sampling portion, a measurement portion, and a determination portion. The transceiver emits the search wave and receives the reflected wave. The sampling portion generates a sampling data and causes the memory portion to store the sampling data. The sampling portion includes a first processing unit and a second processing unit. The first processing unit causes the memory portion to store the sampling data as a first signal data. The second processing unit causes the memory portion to store the sampling data as a second signal data. The measurement portion measures the flight time and generates a measurement value of the flight time. The determination portion determines a sampling period.


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