The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Sep. 07, 2012
Jan Ole Blumhagen, Erlangen, DE;
Matthias Fenchel, Erlangen, DE;
Ralf Ladebeck, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method and magnetic resonance (MR) apparatus to image a partial region of an examination subject by means of a multislice measurement, which partial region includes at least two measurement slices, and is located at least in part at the edge of a field of view of the magnetic resonance apparatus, for each voxel to be optimized that is located at the edge of the field of view, a gradient field is configured for each measurement slice of the partial region that is to be measured and is used to acquire magnetic resonance data in the multislice measurement. The gradient field is configured so as to cause a nonlinearity of the gradient field and a Bfield inhomogeneity to cancel at each of the aforementioned voxel to be optimized at the partial region at the edge of the field of view. An image of the partial region of the examination subject is determined from the magnetic resonance data acquired in this manner.