The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
May. 10, 2012
Applicant:
Gan Wen, Beijing, CN;
Inventor:
Gan Wen, Beijing, CN;
Assignee:
Telefonaktiebolaget LM Ericsson (publ), Stockholm, SE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 31/319 (2006.01); G01R 31/3185 (2006.01); G01R 31/317 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/319 (2013.01); G01R 31/2851 (2013.01); G01R 31/31723 (2013.01); G01R 31/318513 (2013.01);
Abstract
A method for testing a multi-chip system with multiple ports includes determining a test path formed by connecting the multiple ports. The test path is determined in such a way that the internal logic circuit of each chip in the multi-chip system is bypassed. The method further includes injecting a test traffic to the test path, and receiving the test traffic from the test path.
Wen, Gan. (2017). Method for testing a multi-chip system or a single chip and system thereof (U.S. Patent No. 9753087). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9753087
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile