The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Oct. 02, 2015
Applicants:

Ha-young Kim, Seoul, KR;

Sung-wee Cho, Hwaseong-si, KR;

Dal-hee Lee, Seoul, KR;

Jae-ha Lee, Anyang-si, KR;

Inventors:

Ha-Young Kim, Seoul, KR;

Sung-Wee Cho, Hwaseong-si, KR;

Dal-Hee Lee, Seoul, KR;

Jae-Ha Lee, Anyang-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/00 (2006.01); G01R 31/3185 (2006.01); H03K 3/3562 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318541 (2013.01); H03K 3/35625 (2013.01);
Abstract

A scan flip-flop includes an input unit and a flip-flop. The input unit is configured to select one signal from among a data input signal and a scan input signal to supply the selected one signal as an internal signal according to an operation mode. The flip-flop os configured to latch the internal signal according to a clock signal. The flip-flop includes a cross coupled structure that includes first and second tri-state inverters which share a first output node and face each other.


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