The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Mar. 14, 2014
Anritsu Company, Morgan Hill, CA (US);
Jon S. Martens, San Jose, CA (US);
ANRITSU COMPANY, Morgan Hill, CA (US);
Abstract
A method for obtaining improved resolution pulsed radio frequency (RF) measurements with phase coherence for a device under test (DUT) using a vector network analyzer (VNA) includes generating a pulsed RF test signal, transmitting the pulsed RF test signal to the DUT and receiving a signal from the DUT at the VNA in response to the pulsed RF test signal. An intermediate frequency (IF) signal is generated using a local oscillator (LO) signal. A phase of the LO signal is shifted by a prescribed amount while generating the IF signal. The IF signal is then sampled over multiple pulses and measurements are constructed from the measurements. A discrete Fourier transform (DFT) is then applied to the constructed measurements.