The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Jun. 13, 2014
Canon Kabushiki Kaisha, Tokyo, JP;
Francisco Imai, Mountain View, CA (US);
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Systems, devices, and methods for detecting light obtain a first light-measurement objective, wherein a light-measurement objective defines one or more of an intensity of emitted light, a spectrum of emitted light, a spectrum of detected light, and a reflectance angle of detected light; obtain a second light-measurement objective; obtain an angular-dependence objective, wherein the angular-dependence objective defines a difference between a first light-reflection angle and a second light-reflection angle; select first settings values for one or more first illumination-emission devices and one or more first illumination-detection devices based on the first light-measurement objective; select second settings values for one or more second illumination-emission devices and one or more second illumination-detection devices based on the second light-measurement objective; and select a speed of an object conveyor based on the angular-dependence objective.