The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Mar. 28, 2016
Sysmex Corporation, Kobe-shi, Hyogo, JP;
SYSMEX CORPORATION, Kobe-shi, JP;
Abstract
A sample analyzing method for suppressing an adverse effect on detection accuracy of a detection target substance is disclosed. In the sample analyzing method, a magnetic particle as a support of a detection target substance is transported by magnetic force to a second liquid container through a passage between a first liquid container storing a first liquid containing the magnetic particle and the second liquid container storing a second liquid containing a labeled substance to forma complex with the detection target substance and the magnetic particle. The complex formed in the second liquid container and containing the detection target substance, magnetic particle, and labeled substance is transported to a third liquid in a flow path, and the magnetic particle is transported to a detection tank for detecting the detection target substance, while being agitated in a mixed liquid of the complex and third liquid within the flow path.