The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Oct. 17, 2013
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:
Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 27/28 (2006.01); G02F 1/133 (2006.01); G01N 21/65 (2006.01); G02B 5/30 (2006.01); G01J 3/44 (2006.01); G02B 21/00 (2006.01); G01J 3/02 (2006.01); G01N 21/49 (2006.01); G02B 5/06 (2006.01);
U.S. Cl.
CPC ...
G01N 21/64 (2013.01); G01J 3/0224 (2013.01); G01J 3/44 (2013.01); G01N 21/645 (2013.01); G01N 21/6445 (2013.01); G01N 21/65 (2013.01); G02B 5/3083 (2013.01); G02B 21/0092 (2013.01); G02F 1/13306 (2013.01); G01N 21/49 (2013.01); G01N 21/6458 (2013.01); G01N 2201/0638 (2013.01); G02B 5/06 (2013.01); G02B 27/283 (2013.01);
Abstract

An arrangement having a birefringent component is provided for use in spatial offset measurements and analysis systems. The birefringent optical arrangement provides different directional control of the excitation signal relative to the emission signal, so that offset between an excitation and emission location on a sample can be controlled for both or only one of the excitation signal relative to the emission signal.


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