The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Sep. 05, 2014
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Hiroyuki Minato, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto-shi, JP;
Abstract
Provided is a method for performing a wavelength calibration of a monochromator with a diffraction grating by casting light from a standard light source whose emission intensity contains a change with a predetermined cycle onto the diffraction grating and measuring an intensity of light reflected by the grating. The method includes the steps of: measuring at least two times the intensity of the reflected light from the grating within the aforementioned cycle at each of the rotational positions of the grating corresponding to a range of wavelengths including a peak wavelength of a bright line spectral light generated by the standard light source; determining an intensity valueat each rotational position based on all the measured values obtained at the rotational position; and locating, as the peak wavelength of the bright line spectral light, a wavelength at which the intensity valueis maximized.