The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
May. 10, 2012
Juerg Hinderling, Marbach, CH;
Bianca Gordon, Weissensberg, DE;
Bernd Walser, Heerbrugg, CH;
HEXAGON TECHNOLOGY CENTER GMBH, Heerbrugg, CH;
Abstract
A device having a scan function comprising an electro-optical distance measuring element having a laser axis as the target axis, a motorized optical deflection unit, which deflects the target axis by a deflection angle, and an angle measuring element for determining at least one angular position of the deflection unit. First measurement of angle coordinates of a reticle in a first angular position of the deflection unit as the first position, and second measurement of angle coordinates of the reticle in a second angular position of the deflection unit as the second position. The first and second measurements of the reticle are carried out on the basis of images taken with a camera, the optical axis of which is deflected by the deflection unit, and calibration parameters are determined on the basis of the angular positions and the angular coordinates in the first and second positions.