The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Jun. 01, 2015
Hitachi, Ltd., Tokyo, JP;
Yusuke Fujii, Tokyo, JP;
Toru Umekawa, Tokyo, JP;
Masumi Umezawa, Tokyo, JP;
Hiroki Shirato, Sapporo, JP;
Kikuo Umegaki, Sapporo, JP;
Naoki Miyamoto, Sapporo, JP;
Taeko Matsuura, Sapporo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A charged particle irradiation system is capable of shortening the irradiation time and the treatment time by performing efficient irradiation even when irregular variation occurs in the irradiation object during the gating irradiation. The extraction of the beam is stopped upon reception of a regular extraction permission end signal which is outputted based on a regular movement signal. An extractable state maintaining function operates upon the reception of the extraction permission end signal. When a preset standby time elapses without receiving an extraction permission start signal again during the standby time, the extractable state maintaining function finishes its operation and a charged particle beam generator decelerates the beam. Also, the extraction of the beam is stopped due to reception of an irregular extraction permission end signal during the irradiation. When the extraction permission start signal is received again during the standby time, the extraction of the beam is restarted.